Analyzer of parameters for conducting, superconducting and semiconductor structures
Автор: Zharkov I.P., Ivaschenko A.N., Safronov V.V., Solonetsky A.I.
Журнал: Научное приборостроение @nauchnoe-priborostroenie
Рубрика: Поверхность
Статья в выпуске: 4 т.22, 2012 года.
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For the purpose of efficient finding out of small nonlinearities in micro-contact and tunnel spectroscopy it is designed and manufactured the inexpensive serial analyzer of parameters of conducting, superconducting and semiconductor structures.
Nonlinearities, microcontact tunnel spectroscopy, superconducting structures, analyzer of parameters
Короткий адрес: https://sciup.org/14264822
IDR: 14264822
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