The information-measuring and computing system for analysis of magnetic stray fields from electrical devices

For checking the conformity of magnetic stray fields of mass-produced electrical products to the designed standards features, caused by various physical and chemical background of the systems that create these fields are not taken into account. The presented information-measuring computer system receiving and processing the stray fields using electron-optical moire technique facilitates the analysis of conformity of the projected field of the real standards, which is particularly important in the manufacture and commissioning of electrical devices.