A CONSTRUCTIVE SOLUTION FOR A DUAL SPHERICAL ELECTRIC FIELD STRENGTH DETECTOR WITH BIANGULAR SENSITIVE ELEMENTS

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The article highlights the formation of sensitive elements in a dual spherical detector of electric field strength. The construction of a dual detector is based on two double detectors located on the same coordinate axis. The dual detector consists of a conductive sphere and three pairs of sensing elements. Sensitive elements are part of a spherical surface and are formed as a result of cutting the sphere by three planes passing through its center and a plane passing through the center of the sphere perpendicular to its axis of rotation. The planes dissect the sphere into six sensitive elements in the form of spherical biangles, organized into three diametrically opposite pairs. In the first pair, two sensitive elements located on the same coordinate axis are central, the remaining sensitive elements included in the other two pairs are lateral. A pair of central sensor elements is part of the first double detector. Two pairs of lateral sensitive elements, combined with a pair of central ones, form the composite sensitive elements of the second double detector. The compiled mathematical model of a dual spherical detector with sensitive elements in the form of spherical biangles made it possible to determine the best angular dimensions of the sensitive elements in terms of obtaining the minimum error due to field inhomogeneity and the permissible spatial range of measurements. It has been revealed that the central sensitive elements of the dual detector should have a range of angular dimensions limited by the longitudinal 201 = 62° and transverse 201 = 180° angles, and the lateral elements — by 202 = 58° and 202= 180° angles of the longitudinal  and latitudinal  angles of the polar coordinate system. This solution will provide the dual detector with a field strength measurement error of (a)   0.7% in the permissible 0  a  0.94 spatial measurement range.

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Twin spherical sensor, double-angle sensing element, electric field, error from field inhomogeneity, distance to the field source

Короткий адрес: https://sciup.org/142242722

IDR: 142242722

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