Method of ions temporary dispersion compensation in time of flight mass spectrometer
Автор: Semkin N.D., Rodin D.V., Piyakov I.V., Pomelnikov R.A.
Журнал: Научное приборостроение @nauchnoe-priborostroenie
Рубрика: Элементный анализ
Статья в выпуске: 4 т.22, 2012 года.
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The method of calculating the extrusive impulse, compensating temporary dispersion of the ions occurrence in the TOF mass spectrometer is given. The application of the method to the design of a mass spectrometer with two reflectors is described. Resolution simulation of the device in an axial approximation for various combinations of accelerating, reflecting potentials, the choice of the base weight, factors, decreasing the resolution of the mass spectrometer are given. For each of the combinations the results of dependencies modeling are given, the influence estimations of various factors on the resolution of the device are carried out. On the ground of the obtained results the conclusion about the optimal choice of the initial parameters of the calculation was made.
Time of flight mass spectrometer, dynamic extrusive impulse, mass analyzer, mass-reflectron, linear ion mirror, parabolic reflector, micrometeoroid
Короткий адрес: https://sciup.org/14264815
IDR: 14264815