Point measurements of topography, interaction forces and local properties: new approach to the complex analysis in atomic force microscopy

We discuss the use of atomic force microscopy (AFM) in biology, medicine, etc. The point measurement technique for relief, interaction forces and local properties study is suggested. The influence of shear forces is totally eliminated because lateral movement of the probe occurs without contact with the surface. The principle of operation, possibilities and advantages of the method are described. The experimental data confirm the possibility of complex approach to AFM study.