The methodology of lb film structure analysis by means of high resolution microscopy

The heuristics models of structure forming in thin (1-3 layers) Langmuir-Blodgett (LB) films are suggested and studied. The models are designed on experimental results of studying LB films by means of atomic force microscopy (AFM). Domain is shown to be a base element of LB films. The hypothesis of spread in domain values, being in accord with Yeh domain model, is discussed. The model of film growth based on analysis of homogeneity and continuity of film structure is suggested.