Multi-purpose spectrometer for condensed media surface and bulk studies. III. Experimental procedure and investigation results
Автор: Irkaev S.M., Semenov V.G., Kurochkin V.E., Makarov N.A., Panchuk V.V., Ter-martirosyan A.L., Cherneutsanu K.P.
Журнал: Научное приборостроение @nauchnoe-priborostroenie
Рубрика: Исследования, приборы, модели и методы анализа
Статья в выпуске: 2 т.17, 2007 года.
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The third part of paper "Multi-purpose spectrometer for condensed media surface and bulk studies" (see "Nauchnoe Priborostroenie", v. 14, N 3 (2004) and v. 15, N 1 (2005)) describes functional capabilities of the spectrometer designed to study the surface and bulk of condensed media. Herein, the experimental procedure, software for jointly processing the data acquired by the X-ray reflectometry, X-ray fluorescence, and Mцssbauer methods, and also results of studying the spin structure and metering the profile of elements and phase distribution in multi-layer synthetic structures Fe/V and Fe/Cr are described.
Короткий адрес: https://sciup.org/14264483
IDR: 14264483
