Modelling of a micro-XRF spectrometer, estimation of the analytical and metrological characteristics
Автор: Chizhova E.V.
Журнал: Научное приборостроение @nauchnoe-priborostroenie
Рубрика: Приборы микро- и наноисследований
Статья в выпуске: 2 т.22, 2012 года.
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Using physical and mathematical models of the X-ray fluorescence a modelling of the micro-XRF spectrometer is carried out for optimization of the micro-XRF scheme. All the results of theoretical and experimental studies confirm the consistency of the analysis performed and allow to estimate the analytical characteristics of the micro-XRF spectrometer.
Micro-xrf analysis, optimization of the micro-xrf scheme, analytical and metrological characteristics
Короткий адрес: https://sciup.org/14264791
IDR: 14264791