Multispectral speckle-method of half translucent objekt vrification

In this paper the two-waves speckle-pictures (the sums of the speckle-pictures with at various waves lengths) correlation analysis for the statistical description of parameters of a roughness of object in the scheme strong scattering object is executed. Experimentally received speckle-picture from matte glass at illumination by semi-conductor laser diodes with waves lengths micron and micron was fixed on the CCD-matrix (the digital camera with a matrix 6 Mega pixels). Correlation factors comparison of various samples according to a various degree of a roughness of investigated surfaces is lead.