On nonparametric diagnosis and control of the process of electronics manufacture

The paper examines the problems of electronics diagnosis according to the data of non-destructive control. In particular, the results of some types of integrated circuits diagnostics, transistors and diode matrices are considered. As a result of diode matrices processing, different groups of applicable items were revealed. Some numerical results of diagnostic parameters processing are given. In this context, the task analysis of the technological processes of electronics manufacture of the specified quality is analyzed. The non-parametrical models of discrete-continuous processes for different technological stages of production are given. The sequence of control actions generation for the whole technological cycle is presented as well. The non-parametric estimations, models, algorithms of control and decision-making are based on nonparametric statistics of Nadaray-Watson. The specific non-parametric models and algorithms that can be used as a basis for design of computer systems of diagnostics electronics test results of non-destructive control,as well as in the development of computer control systems of technological process at manufac ture of electronics are given.