Planar time-of-flight multireflecting mass spectrometer with orthogonal ion injection out of continuous ion sources

The paper continues the series of articles dedicated to the development of planar multireflecting time-of-flight mass analyzers. a prototype of an instrument is developed with orthogonal acceleration of ions out of continuous ion sources like Atmospheric Pressure Ionization (API) and Electrospray (ESI) ones. The prototype demonstrates a mass accuracy of 1 ppm and high mass resolution around 30 000 in combination with the full mass range. Even higher mass resolution around 100 000 is achievable in the zoom mode by enclosing ion trajectories into loops. A limited duty cycle of the orthogonal accelerator is improved by intermediate ion accumulation within the RF ion guide.