Application of a DVD disc as a test object for assessing the spatial resolution of a scanning ion-conductance microscope

The feasibility of utilizing polymer test structures on DVD discs, which consist of regular arrays of convex and concave elements with fixed width and depth, for evaluating the spatial resolution and linear dimensions in scanning ion-conductance microscopy (SICM) is demonstrated. The combination of cross-sectional measurements obtained via atomic force microscopy (AFM) and SICM enabled calibration of the scanner's linear dimensions and assessment of the resolution in SICM by measuring the broadening of height transition boundaries of the disc's regular structures. The study also shows the potential for evaluating the spatial resolution and penetrating capability of nanopipettes with varying aperture sizes and convergence angles.