Calculation of static perturbations in the Orbitrap mass analyzer employing quadro-logarithmic potential with perfect time-of-flight focusing

Application of the averaging method to modeling of static perturbations of the Orbitrap mass analyzer allows to explore influence of inaccuracies of manufacturing and voltages on the frequency of axial oscillations of ions and mass resolution. It is shown that shift of the electrodes relative to each other leads only to perturbations of higher order of smallness, while the inaccuracy of electrode shape and presence of the slot for ion injection are the key factors determining the resolution of the analyzer. Examples of mutual compensation are presented for various deviations from the ideal field.