Development and simulation of forward current test pulse generator for studying power diodes

Автор: Bespalov N.N., Goryachkin Yu.V., Pankin K.Yu.

Журнал: Огарёв-online @ogarev-online

Статья в выпуске: 13 т.10, 2022 года.

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The article presents the results of the simulation of a circuit design solution for a direct current pulse generator for testing semiconductor devices and a program for generating a control voltage of a half-sine waveform of a test pulse in the form of a 12-bit binary code in the VHDL language. The operation algorithm of the generator of half-sinusoidal current pulses is described.

Vhdl

Короткий адрес: https://sciup.org/147250169

IDR: 147250169

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