X-ray difraction study of borides of transition metals

Precision X-ray diffraction experiments were carried out for single crystals Mo 2B 5 at room temperature (Syntex P21 diffractometer, MoK α radiation). Comparison of the calculated and literary structural parameters is performed. It was revealed that the structure contained defect layers of boron atoms of type К' instead of the previously assumed layers of type К'. It was expected that such layers unoccupied К layers are available in all related structural types. This feature had to be considered in the refinement of the relevant structures. Apparently, such regularity in the structure is applicable for the other representatives of the AlB 2 family.