Resonant-optical methods of investigations of nonlinear submicron interfaces

The review contains a brief description of polarization-optical methods of investigations of resonant interfaces, which are developing in the Institute for Analytical Instrumentation RAS. The selective reflection spectra under conditions close to the resonant total internal reflection and resonant Brewster reflection are presented. Comparison of selective reflection features of laser radiation with various orientations of a polarization plane is carried out. The possibilities for observation in conditions under study of the new nonlinear phenomena are discussed. Spectra of fluctuations of resonant-reflected light are analyzed.