Specialized SPM-probe based on wireframe nanowhisker structures

By means of focused ion beam technique in the gas-precursor presence wireframe nanostructures (WFNS) consisted of conductive nanowhiskers were created and visualized at the top of W and Si tips. The minimal lateral size of growth nanowhisker was about 15 nm. The perspectives of WFNSs used as specialized SPM-probes for scanning magnetic microscopy and study of surfaces of bottom and vertical walls of deep micro- and nanochannels are discussed.