A statistical theory of x-ray diffraction on a superlattice with correlated spheroidal quantum dots
Автор: Punegov V.I., Sivkov D.V.
Журнал: Известия Коми научного центра УрО РАН @izvestia-komisc
Рубрика: Физико-математические науки
Статья в выпуске: 2 (18), 2014 года.
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A statistical theory of X-ray diffraction on a semiconductor superlattice is developed taking into account the spatial correlation of spheroidal quantum dots. The angular distribution of coherent and diffuse scattering, depending on the structural characteristics of the SL is studied. A numerical simulation of X- ray diffraction on GaAs (001)-Al GaAs-{InAs QDs-GaAs} x20 superlattice is performed. The calculated results are compared with experimental data
Quantum dots, x-ray diffraction, coherent and diffuse scattering
Короткий адрес: https://sciup.org/14992678
IDR: 14992678
