Effect of shungite plate thickness on its electrophysical properties: technological and geophysical aspects

This brief report presents the results of our study of the effect of shungite sample thickness (both shungite rocks and vein forms comparable to higher anthraxolites) on their electrophysical properties. The study was conducted by measuring impedance in the frequency range of 0.05-15 MHz. Shungite samples with a carbon content of 96, 95, 73, and 38 at. % and a thickness ranging from 5 mm to 12-15 µm were studied. A significant increase in resistance was found with a decrease in sample thickness to 100 µm or less. In this case, the inductive resistance typical of shungite macrosamples changes to capacitive resistance or only active resistance appears. Thus, it is shown that not only the total content, but also the form and dimensionality of the occurrence of such carbon affects the electrophysical properties of the rock. The obtained results can be used to interpret electrical exploration data of rocks containing disordered carbon (shungites, anthraxolites) in vein and lenticular form, and also to show new prospects for the use of such carbon in the development of functional materials.