A flat chart technique for embedded OS testing
Автор: Nikiforov V.V., Baranov S.N.
Журнал: Труды Института системного программирования РАН @trudy-isp-ran
Статья в выпуске: 5 т.29, 2017 года.
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Modern automatic devices are more and more equipped with microcontroller units. The logic of work of the automatic equipment is supported by a number of various embedded software applications, which run under an embedded real-time operating system (OS). The OS reliability is extremely important for correct functionality of the whole automatic system. Therefore, the embedded OS should be tested thoroughly with an appropriate automated test suite. Such test suite for testing of an embedded OS is usually organized as a set of multi-task test applications to be executed in a data-driven manner. The paper features a special language to define the respective testing task logic and the concept of flat charts to efficiently perform an embedded OS execution-based testing. To avoid heavy interpreting of text strings during the test run, the respective test presentation is pre-processed in order to convert the initial string form into a regular array form and thus to increase its efficiency.
Embedded applications, operating systems, software testing, real-time systems
Короткий адрес: https://sciup.org/14916482
IDR: 14916482 | DOI: 10.15514/ISPRAS-2017-29(5)-5
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