Equilibrium distribution of defects in cadmium telluride before exposure to external factors

Автор: Paklin N.N., Loginov Yu.Yu., Mozzherin A.V.

Журнал: Siberian Aerospace Journal @vestnik-sibsau-en

Рубрика: Technological processes and material science

Статья в выпуске: 2 vol.23, 2022 года.

Бесплатный доступ

The reliability of electronic equipment, including in the aerospace industry, both under normal and extreme conditions, is associated with the degradation of materials due to the formation and development of a defective network. Cadmium telluride is one of the semiconductors that is actively used in the creation of solar cells and modern microelectronic devices. In this paper, the model of the point defects distribution in cadmium telluride before exposure to any ionizing radiation is proposed, that made it possible to calculate the effective thermal activation energy of a Frenkel pair equal to 1.37 eV. Studies of the features of the defects formation and evolution using modeling methods in cadmium telluride, in the future, will improve the quality of its technological use, saving financial resources and increasing the reliability of products.

Еще

Cadmium telluride, dynamics of structural defects, thermal activation energy

Короткий адрес: https://sciup.org/148329629

IDR: 148329629   |   DOI: 10.31772/2712-8970-2022-23-2-315-320

Список литературы Equilibrium distribution of defects in cadmium telluride before exposure to external factors

  • Yujiea L., Guolic M., Wanqi J. Point defects in CdTe. Journal of Crystal Growth. 2003, Vol. 256, P. 266–275.
  • Loginov Y. Y., Brown P. D., Durose K. Zakonomernosti obrazovaniya strukturnykh defektov v poluprovodnikakh A2V6 [Regularity of the structural defects formation in semiconductors A2B6]. Moscow, Logos, 2003.
  • Loginov Y. Y., Mozzherin A. V., Paklin N. N. Particularities of the interstitial atoms and vacancies clusters formation in a thin cadmium telluride foil during in situ electron irradiation in a TEM. IOP Conf. Series: Materials Science and Engineering. 2022. Vol. 1230. P. 012013. Doi: 10.1088/1757-899x/1230/1/012013.
  • Djafari-Rouhani M., Gue A., Idrissi-Saba H., Esteve D. Simulation a l'echelle atomique de la formation des boucles de dislocation sous irradiation. Journal de Physique I, EDP Sciences. 1994, Vol. 4 (3), P. 453–466.
  • Loginov Yu. Yu., Mozzherin A. V., Bril’kov A. V. Dependence of the Critical Radius of Partial Dislocation Loops on the Stacking Fault Energy in Semiconductors. Physics of the Solid State. 2014, Vol. 56, No. 4, P. 720–722.
  • Gorichok I. V. Enthalpy of Schottky Defects Formation in Semiconductors. Physics of the Solid State. 2012, Vol. 54, P. 1373–1376.
  • Freysoldt C., Grabowski B., Hickel T., Neugebauer J., Kresse G., Janotti A., Van de Walle C. G. First-principles calculations for point defects in solids. Rev. Mod. Phys. 2014, Vol. 86, No. 1.
  • Corbett J., Bourgoin J. Defektoobrazovanie v poluprovodnikakh [Defect formation in semiconductors]. Moscow, Mir Publ., 1979, P. 9–162.
  • Vavilov V. S., Kiv A. E., Niyazova O. R. Mekhanizmy obrazovaniya i migratsii defektov v poluprovodnikakh [Mechanisms of the defects formation and migration in semiconductors]. Moscow, Nauka Publ., 1981, 368 p.
  • Vavilov V. S., Kekelidze N. P., Smirnov L. S. Deystvie izlucheniy na poluprovodniki [Effect of radiation on semiconductors]. Moscow, Nauka Publ., 1988, 192 p.
Еще
Статья научная