Simulation computer model for virtual research of optoelectronic measuring systems

The paper considers a simulation computer model of an optoelectronic system for measuring the point objects coordinates. The model allows optimal coordination of the system links parameters in order to minimize the measurement error. The method of multiple statistical tests which allows accumulating the results of single computational experiments for each specific measurement event with a unique random distribution of links parameters and characteristics, and then carrying out statistical processing of the accumulated results is the main method of computer simulation. As a result of multiple analyses, multi-parameter functional dependencies that provide optimal coordination of parameters controlled by the designer or operator according to the criterion of the resulting measurement error minimizing are realized. The article presents the results of evaluating modeling parameters that reduce the measurement error. It is relevant to apply this method when using the same measuring system in different operating conditions, for different measured objects and when performing various functional tasks since it allows adapting the system for a specific application. The model presented in the article can be concretized for the purpose of evaluating and multi-parameter optimization of particular object parameters, as well as for developing a virtual measuring stand on the basis of the model and its modifications.