Study of polarization sensitivity of near-field microscope using a binary phase plate

We investigate theoretically and experimentally distribution of electric field components in a focal plane at rotation of a plate with p-phase jump placed in the focused beams. We analyze the polarizing sensitivity of the various apertured metalized probes on the basis of comparison of theoretical and experimental results. It is shown, that with growth of diameter of the aperture window of a probe an essential change of sensitivity occurs in favor of transverse components of the electric field and growth of signal transfer factor of a probe.