The determination of the radius of curvature of water sessile drops in the process of the free evaporation by the interferometric method

The time dependences of the radius of curvature in the vertice of the sessile drops are determined in conditions of the free evaporation with the aid of the earlier suggested interferometric method. The substrate's influence on the behavior of the registered parameters is studied. It is shown, that this influence differs in the cases of even and coarse substrate specified by the ability to hold the three phase contact line in place.