MEASUREMENT OF THE COMPONENTS OF THE COMPLEX RESISTANCE OF MUTUAL INDUCTION

A microcontroller device for digital measurement of the components of the complex resistance of mutual induction of magnetically coupled coils has been developed for the case, when due to the effects of "capacitance" and "eddy currents", an "impurity" and a "phase defect" arise in the EMF of mutual induction. An active component appears in the complex resistance of mutual induction. For invariant measurement of the components of this resistance, a phase method was used in combination with a timing separation of the measurement channel. The measuring circuit (MC) is powered by the current of a controlled generator for sinusoidal signals. An informative parameter of the MC output signal is the angle of the phase shift between two voltages. These voltages are supplied to the analog inputs of the programmable microcontroller (MCU). During the measurement, the MCU sets the generator frequency, controls the switching of the measurement channel, measures the phase shift angle between the MC output voltages, and calculates the components of the complex mutual induction resistance according to the given algorithms. The theory of the method, the technique for calculating the parameters of the MC elements, the evaluation of the sensitivity of the conversion, and the analysis of measurement errors are presented.