Analysis of time domain reflectometry for secret intelligence devices location

Автор: Mikhaylovskaya Anastasiya, Pancyr Rodion

Журнал: Бюллетень науки и практики @bulletennauki

Рубрика: Технические науки

Статья в выпуске: 5 (6), 2016 года.

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This article provides an overview of the time-domain reflectometry and secret intelligence devices location using reflectometers an example of equipment for data investigation in wired lines “Sirius”. It resulted in the comparative analysis of the traces obtained from the study of various defects and connections to the cable. Such traces are possible to determine the exact distance to the connection. It gives the ability to detect secret intelligence devices.

Secret intelligence device, reflectometer, time-domain reflectometry, time-domain reflectometry trace, wave impedance, velocity factor

Короткий адрес: https://sciup.org/14112356

IDR: 14112356   |   DOI: 10.5281/zenodo.54827

Статья научная