A coherent measurement method for checking the surface microrelief depth in holographic and diffractive optical elements
Автор: Kolyuchkin Vasily Vasilievich, Zlokazov Evgeny Yurievich, Odinokov Sergey Borisovich, Talalaev Vladimir Evgenievich, Tsyganov Ivan Konstantinovich
Журнал: Компьютерная оптика @computer-optics
Рубрика: Дифракционная оптика, оптические технологии
Статья в выпуске: 4 т.39, 2015 года.
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Security holograms have been widely used for document and product authenticity protection. The quality of security holograms and master-matrices significantly depends on the perfection of the diffraction grating. The authors introduce a method for checking the security hologram quality based on indirect measurements of diffraction grating parameters. Theoretical results concerned with the use of this method for microrelief quality control are discussed.
Holography, diffraction gratings, diffraction theory, holographic optical elements, diffractive optical elements
Короткий адрес: https://sciup.org/14059391
IDR: 14059391 | DOI: 10.18287/0134-2452-2015-39-4-515-520
