Methods of diagnosis of state building optoelectronics systems

The problems of diagnostics of the technical state of the optoelectronic system (OES) are considered. A methodology for determining the main parameters of the state of the OES based on the application of various measurement algorithms for analyzing its optical image is developed. On the basis of algorithms for analyzing the coefficients of continuous wavelet transformation of light distribution in lines of image contrast profiles, new possibilities for diagnosing OES state are shown, such as defocusing and misalignment of the viewing angle of the optical axis of the system to the observed object.