On the compensation of the diffraction orders overlap effect in the Offner spectrometer

We analyze the performance of a diffraction-grating-based Offner spectrometer. We use the paraxial approximation to derive analytical expressions for the spatial and spectral point spread function for each diffraction order. We show that a disruptive effect of the diffraction orders overlap occurs. However, it can be compensated for by means of simple image post-processing.