Optical measurement of characteristics of thin films using a spiral zone plate
Автор: Nalimov A.G., Kozlova E.S., Stafeev S.S., Kotlyar V.V., Podlipnov V.V.
Журнал: Компьютерная оптика @computer-optics
Рубрика: Дифракционная оптика, оптические технологии
Статья в выпуске: 1 т.49, 2025 года.
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In this work we propose a method for measuring physical characteristics of thin samples (thin films), including thickness, refractive index and tilt by moving the observation plane. The measurements are made utilizing a vortex spiral zone plate, which forms three intensity maxima that rotate when moving along optical axis. The error in measuring the tilt of a sample is a fraction of a degree, and the error in measuring its thickness is less than 5 nm. By the numerical simulation, three intensity maxima are shown to be formed after a metalens, rotating in space with an angular velocity of 136°/μm, which is almost twice as high as was reported in similar works.
Spiral zone plate, thickness sensor, shift sensor
Короткий адрес: https://sciup.org/140310437
IDR: 140310437 | DOI: 10.18287/2412-6179-CO-1493