Features of obtaining films MnxSiy on silicon by solid-phase reaction
Автор: Yakubov Komiljon, Latipova Muborak, Qodirov Alibek
Журнал: Бюллетень науки и практики @bulletennauki
Рубрика: Технические науки
Статья в выпуске: 4 т.7, 2021 года.
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Recently, in the development of new device structures, structures with various metals on silicon have been used. Numerous studies have shown that as a result of solid-phase reactions of Mn and Si, it is possible to create heterophase systems from various manganese silicide. Such films possessing a unique set of thermoelectric properties. At the present time, obtaining a film with high values of a sufficient thermo-EMF, the maximum thermoelectric figure of merit of these materials of the pack has not yet been achieved. In this regard, there is a need for a detailed study of the structure and perfection of manganese silicide - silicon films obtained on a silicon substrate. In this work, we study the solid-phase reaction in the Mn-Si diffusion system and the process of the formation of manganese silicide phases on a silicon substrate.
Silicon, silicide, manganese silicide, electrical conductivity, polycrystalline film, spectrum amplification, spectroscopy, electrophysical properties, photoelectric properties, heterostructure, phase, solid-phase reaction
Короткий адрес: https://sciup.org/14120943
IDR: 14120943 | DOI: 10.33619/2414-2948/65/28