Prospects for using modern high-resolution matrices in optical-electronic stations

The article presents the basic principles of operation of high-resolution CCD and CMOS matrices used in various systems, including measuring equipment, indicates the advantages and disadvantages of each type of matrix, determines the reason for using CCD matrices in modern optical-electronic measuring instruments, substantiates the need to use CMOS matrices in promising optical-electronic measuring instruments, considers a method for improving the quality of measurement information and further accompanying development of measuring instruments.