The device for measurement of spectral density of capacity of noise two-polars

The device for measurement of spectral density of capacity of noise two-polars is developed of the microcontroller. The block diagram, algorithm of operation and design of the device show in the paper. The characteristics of the device are measured: spectral density of capacity of noise of the microcontrollers analog-digital converter for various cases. The noise characteristics of the amplifier were measured in three cases: for the amplifier without the shielding case, for the amplifier in the shielding case without a separate feed and with a separate feed of measuring and basic printed-circuit board. Measurements of spectral density of capacity of noise of resistors of various face values by several methods are shown in this paper. The program for autoregress estimation of spectral density of capacity of noise is developed and analyzed for various orders of autoregression.