Calculation and optimization of the parameters of measurement units of automated control systems

The article discusses the methods of monitoring and measuring, and circuit solutions for automated control systems of various objects, which are characterized by measurement of extremely small currents and voltages. Graphic-analytical methods for optimal parameters searching for measuring units on the basis of the equations of sensitivity with the possibility of processing the results of measurements on the microcontroller are discussed, allowing more accurate and parametric stability of the probes. A comparison of the results with experimental data is presented.