Ray photoelectron analysis of vanadium oxide anodic films
Автор: Velichko A.A., Boriskov P.P., Cheremisin A.B., Stefanovich G.B.
Журнал: Ученые записки Петрозаводского государственного университета @uchzap-petrsu
Рубрика: Физико-математические науки
Статья в выпуске: 6 (143), 2014 года.
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The XPS analysis results of vanadium oxide anodic films exposed to the plasma, X-ray and ultraviolet radiation are presented. For the first time directly (ab invito) reduced modification in vacuum of metastable oxide films surface was studied and the proportion of oxide phases of the material was estimated.
Transition metal oxides, vanadium oxides, xps analysis, modification
Короткий адрес: https://sciup.org/14751395
IDR: 14751395
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