Scanning ion conductance microscope with simultaneous visualization of the sample surface in the tapping mode

The probe for the simultaneous operation in the scanning ion conductance microscopy (SICM ) mode and in the tapping force mode has been proposed and studied. The numeric modeling of the image of the step on the surface of the dielectric sample in the SICM mode has been carried out. The experimental results which have been obtained by the scanning of the test sample are presented.