Study of structural properties of bismuth pyrostannate by Raman and IR spectroscopy
Автор: L. V. Udod, O. B. Romanova, S. S. Aplesnin, V. V. Kretinin
Журнал: Siberian Aerospace Journal @vestnik-sibsau-en
Рубрика: Technological processes and material science
Статья в выпуске: 4 vol.21, 2020 года.
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Chromium-substituted bismuth pyrostannates with a pyrochlore structure were synthesized by the solid-phase reaction method. The X-ray structural analysis performed at room temperature showed that the samples Bi2(Sn1-xCrx)2O7, x = 0; 0.05, 0.1 are single-phase and belong to the Pc monoclinic structure. Polymorphic transformations of the synthesized samples were studied by Raman and IR spectroscopy. IR spectra were obtained at the temperature range 110–525 K and frequencies 350–1100 cm–1. Raman spectra were measured at room temperature at frequencies of 100–3000 cm–1. Heterovalent substitution of Sn4+ for Cr3+ modifies the spectra of pure Bi2Sn2O7. The crystal structure of Bi2Sn2O7 consists of two oxygen sublattices: SnO6 and Bi2O'. Chromium ions substituted tin ions in the SnO6 oxygen octahedra, distorting the local structure in the vicinity of bismuth ions. Phonon modes are softening in the vicinity of phase transitions. А shift of the phase boundaries of polymorphic transitions is observed for Bi2(Sn1-хCrх)2O7, x = 0.05, 0.1. The frequencies of stretching vibration modes were determined from IR and Raman spectra. The substitution of chromium for tin ions resulted in the appearance of two new modes at frequencies of 581 and 822 cm–1 in the Raman spectra. The absence of an inversion center in the crystal structure of Bi2(Sn1-xCrx)2O7 is confirmed by Raman spectroscopy. IR spectra of chromium-substituted samples consist of complex lines, which decompose into 2 and 3 Lorentzian lines. The softening and broadening of optical absorption modes are associated with the electronic contribution. Impurity states of electrons form polarons.
Bismuth pyrostannate, crystal structure, phase transitions, IR spectroscopy, Raman spectroscopy, X-ray structural analysis.
Короткий адрес: https://sciup.org/148321779
IDR: 148321779 | DOI: 10.31772/2587-6066-2020-21-4-556-564
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