Subwave length focusing of laser light using a chromium zone plate
Автор: Nalimov Anton Gennadyevich, Stafeev Sergey Sergeevich, Ofaolain Liam William Whelan-Curtin, Kotlyar Maria V., Kozlova Elena Sergeevna, Kotlyar Victor Victorovich
Журнал: Компьютерная оптика @computer-optics
Рубрика: Дифракционная оптика, оптические технологии
Статья в выпуске: 3 т.41, 2017 года.
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We study in which way the parameters of a focal spot generated by a chromium zone plate 15-µm in diameter synthesized by sputtering on a glass substrate and having a focal length equal to the incident wavelength of λ = 532 nm depend on the microrelief height. It is shown numerically that an optimal microrelief height of the zone plate is 70 nm. With these parameters, the minimal size of the focal spot is achieved. Using a scanning near field optical microscope the said zone plate is shown to focus a linearly polarized Gaussian beam into an elliptical focal spot having the full-width at half-maximum of FWHMx = 0.42λ and FWHMy = 0.64λ along the Cartesian axes.
Amplitude zone plate, phase zone plate, sharp focus, fdtd-метод, scanning near field optical microscope, fdtd method
Короткий адрес: https://sciup.org/140228616
IDR: 140228616 | DOI: 10.18287/2412-6179-2017-41-3-356-362