Subwavelength focusing using Fresnel zone plate with focal length of 532 nm
Автор: Stafeev Sergey Sergeevich, Ofaolain Liam, Shanina Kotlyar Margarita Innokentievna, Kotlyar Victor Victorovich, Soifer Victor Alexandrovich
Журнал: Компьютерная оптика @computer-optics
Рубрика: Дифракционная оптика, оптические технологии
Статья в выпуске: 4 т.35, 2011 года.
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Using a near-field scanning optical microscope we measure a focal spot resulting from the illumination the phase zone plate with focal length 532 nm, radius 7,7 um and etch depth 510 nm by linearly polarized Gaussian beam with wavelength 532 nm. The diameter of focal spot equals to 0,44 of wavelength. The root-mean-square deviation of the focal spot intensity from the calculated value is 5%.
Scanning nearfield optical microscope, subwavelength focusing of laser light, phase zone plate
Короткий адрес: https://sciup.org/14059039
IDR: 14059039
