Spectral measurement technique and material parameters yig thin films
Автор: Panyaev Ivan, Sannikov Dmitry
Журнал: Известия Самарского научного центра Российской академии наук @izvestiya-ssc
Рубрика: Физика и электроника
Статья в выпуске: 4-4 т.14, 2012 года.
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The results of measurements of the spectral characteristics of thin films of yttrium iron garnet (YIG) are presented, performed on a modernized hardware and test system based on the monochromator MDR-23U. The experimental measurement techniques of parameters of YIG thin films are practiced using interference microscopy, the Brewster angle method and polarization microscope Zeiss.
Spectroscopy, thin films, yttrium iron garnet (yig)
Короткий адрес: https://sciup.org/148201328
IDR: 148201328