The possibilities of atomic force microscopy in the study of crystals and the processes of their growth

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The results of many-year research on atomic force microscopy (AFM) of the processes of crystals growth carried out at the Institute of Geology, Komi Sci. Centre, Ural Branch, RAS, are presented. An analytical review of the methods of direct observa- tion and monitoring the crystals growth is given. According to AFM data, the main factors influencing the real structure and the evolution of the crystal surface at na- nolevel are the differences and fluctuations in the velocities initiated by screw dislo- cations of the growth stages, the peculiarities of the interaction of the stages with obstacles and with each other, the formation and decay of macrostages. We have in- situ studied the growth and dissolution of crystals under various conditions, includ- ing in the flow of solution, under conditions of special mechanical effects on the sur- face, etc. A new method of statistical processing of in situ AFM-images allowing to establish dynamic features of crystal growth from solution was developed. The study of topography of some natural and synthetic crystals and comparison of results with model experiments on growth and dissolution made it possible to partially reconstruct the conditions and mechanisms of crystals growth in minerals.

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Atomic-force microscopy, crystal growth from solution, nanosize processes, crystalline defects

Короткий адрес: https://sciup.org/149128815

IDR: 149128815   |   DOI: 10.19110/1994-5655-2018-4-95-101

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