Dynamic random access memory with redundant transistors

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The article analyzes dynamic random access memory (DRAM). DRAM with a redundant transistor is considered by analogy with a six-transistor SRAM cell, in which the transistors are reserved. The paper estimated the probability of failure-free operation of DRAM with such redundancy compared with triple redundancy.

Ячейка памяти sram, ячейка памяти dram, cmos transistor, sram cell, dram cell, reliability, failure resistance, triple redundancy

Короткий адрес: https://sciup.org/14730082

IDR: 14730082   |   DOI: 10.17072/1993-0550-2016-4-58-62

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