Formal and Informal Modeling of Fault Tolerant Noc Architectures
Автор: Mostefa BELARBI
Журнал: International Journal of Intelligent Systems and Applications(IJISA) @ijisa
Статья в выпуске: 12 vol.7, 2015 года.
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The suggested new approach based on B-Event formal technics consists of suggesting aspects and constraints related to the reliability of NoC (Network-On-chip) and the over-cost related to the solutions of tolerances on the faults: a design of NoC tolerating on the faults for SoC (System-on-Chip) containing configurable technology FPGA (Field Programmable Gates Array), by extracting the properties of the NoC architecture. We illustrate our methodology by developing several refinements which produce QNoC (Quality of Service of Network on chip) switch architecture from specification to test. We will show how B-event formalism can follow life cycle of NoC design and test: for example the code VHDL (VHSIC Hardware Description Language) simulation established of certain kind of architecture can help us to optimize the architecture and produce new architecture; we can inject the new properties related to the new QNoC architecture into formal B-event specification. B-event is associated to Rodin tool environment. As case study, the last stage of refinement used a wireless network in order to generate complete test environment of the studied application.
Self-Organized Network-On-Chip NoC, Testability, Formal proof, Event-B, Code generation, VHSIC Hardware Description Language VHDL
Короткий адрес: https://sciup.org/15010774
IDR: 15010774
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