Graphical Representation of Optimal Time for a Step-Stress Accelerated Life Test Design Using Frechet Distribution
Автор: Sana Shahab, Arif-Ul-Islam
Журнал: International Journal of Information Technology and Computer Science(IJITCS) @ijitcs
Статья в выпуске: 12 Vol. 6, 2014 года.
Бесплатный доступ
The article provides an approach of getting optimal time through graph for Simple step stress accelerated test of inverse weibull distribution. In this we estimate parameters using log linear relationship by maximum likelihood method. Along with this, asymptotic variance and covariance matrix of the estimators are given. Comparison between expected and observed Fisher Information matrix is also shown. Furthermore, confidence interval coverage of the estimators is also presented for checking the precession of estimator. This approach is illustrated with an example using software.
Accelerated Life Testing, Step-Stress, Frechet (Inverse Weibull) Distribution, Maximum Likelihood, Asymptotic Variance (AV), Optimal Time, Confidence Interval
Короткий адрес: https://sciup.org/15012211
IDR: 15012211
Список литературы Graphical Representation of Optimal Time for a Step-Stress Accelerated Life Test Design Using Frechet Distribution
- T.J. Kielpinski, and W.B. Nelson, “Optimum censored accelerated life test for normal and lognormal life distribution,” IEEE Trans. Reliab., vol. R-24, pp. 310-320, 1975.
- W.B. Nelson, and W.Q. Meeker, “Theory for optimum censored life tests forWeibull and extreme life distribution,” Technometrics, vol. 20, pp.171-177, 1978.
- N. Balakrishnana, and D. Han, “Optimal step-stress testing for progressively Type-I censored data from exponential distribution,” Journal of Statistical Planning and Inference, vol. 139, pp. 1782-1798, 2009.
- W.B. Nelson, “Accelerated Testing, Statistical Models,” Test Plans and Data Analysis, Wiley, New York, NY, 1990.
- C. Xiong, “Step stress model with threshold Parameter,” Journal of Statistical Computation and Simulation, vol. 63, pp. 349-360, 1998.
- A.J. Watkins, “Commentary: inference in simple step-stress models,” IEEE Transactions on Reliability, vol. 50, pp. 36-37, 2001.
- W. Zhao, and E. A. Elsayed, “A General accelerated life model for step-stress testing.” IIE Transactions, vol. 37, pp. 1059-1069, 2005.
- N. Balakrishnan, E. Beutner, and M. Kateri, “Order Restricted Inference for Exponential Step-Stress Models,” IEEE Transactions on Reliability, vol. 58, pp. 132-142, 2009.
- K.P. Yeo, and L.C. Tang, “Planning step-stress life-test with a target accelerated factor,” IEEE Transactions on Reliability, vol. 48, pp. 61-67, 1999.
- R. Miller, and B. Nelson, “Optimum simple step-stress plans for accelerated life testing,” IEEE Transactions on Reliability, vol. 32, pp. 59-65, 1983.
- D.S. Bai, M.S. Kim, and S.L. Lee, “ Optimum simple step-stress accelerated life tests with censoring,” IEEE Trans. I Reliab., vol. 38, pp. 528-532, 1989.
- H. Khamis, and J. Higgins, “A New Model for Step-Stress Testing,” 2nd ed., vol. 47, pp. 131-134, June 1998.
- A. Ali Ismail, and M. Ammar, “Optimal Design of Step-Stress Life Test with Progressively type-II Censored Exponential Data,” International Mathematical Forum, 4, vol. 40, pp. 1963 – 1976, 2009.
- L.C. Tang, L.C. Sun., T.N. Goh, and H.L. Ong., “Analysis of step-stress accelerated-life-test data:new approach,” IEEE Trans Reliab., 1st ed., vol. 45, pp. 69–74, 1996.
- G.K. Bhattacharyya, and Z. Soejoeti, “A tampered failure rate model for step-stress accelerated life test,” Communications in Statistics: Theory and Methods, vol. 18, pp. 1627–1643, 1989.
- G.K. Bhattacharyya, “Parametric models and inference procedures for accelerated life tests. Presented as an invited paper for 46th session of the International Statistical Institute Meeting,” Tokyo, Japan, 8–16 September 1986.
- K.A. Doksum, and A. Hoyland, “Models for variable-stress accelerated life testing experiments based on Wiener process and inverse Gaussian distribution,” Technometrics, vol. 34, pp. 74–82, 1991.
- S.A Vander Wiel, and W.Q. Meeker, “Accuracy of Approximate Confidence Bounds using Censored Weibull Regression Data from Accelerated Life Tests,” IEEE Tran.On Reliability, 3rd ed., vol. 39, pp. 346-351, August 1990.
