3 vol.4, 2014 - International Journal of Engineering and Manufacturing
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IDS: 15015468 Short address: https://sciup.org/15015468
Issue table of contents 3 vol.4, 2014 International Journal of Engineering and Manufacturing
Abhishek Agal, Pardeep, Bal Krishan
Comparative Analysis of Various SRAM Cells with Low Power, High Read Stability and Low Area
1
K.Bikshalu, V.S.K. Reddy, M.V. Manasa, K. Venkateswara Rao
Simulation Studies of Silica and High K Oxide Contained MOS Circuits (45nm, 32nm and 22nm) for Power Dissipation Reduction
13