Ellipsometry of a one-dimensional photonic crystal with dielectric and conductive defects

Background. Periodic layered systems have recently attracted researchers and engineers due to their possible wide applications in nanoelectronics. In such systems, in addition to their direct use as a periodic structure, various defects can be studied. Against the background of an ideal periodic structure, reflection from a structure with a defect allows one to obtain important information about the defect itself. Of particular interest is the use of circularly polarized light for these purposes.