The interferogram parameters evaluation required for the curvature radius determination at the top of the sessile drop

In connection with the development of the previously suggested method for the evaporating droplet's shape's parameters's determination we investigated the methods of processing the interference pattern that arises when applying the flat field and a spherical wave field, generated by vertex sessile drop. The aim of these methods is to increase the accuracy and reliability of the estimated optical system's parameters responsible for determining the radius of the curvature of the drop in its top. The processing picture method is introduced. It operates with all the information presented on a digital copy of the interferogram, and shows its advantage compared to local methods those operate only with a part of such information.