Reflection of circularly polarized light from a CdS semiconductor crystal near the exciton resonance taking into account spatial dispersion

Background. The study of materials using polarized radiation allows one to obtain additional information about the properties of the material due to the vector nature of the electromagnetic field. In this regard, the most widely used method is the ellipsometric method for analyzing the optical properties of materials. The use of circularly polarized light carries additional information due to the change in the polarization ellipse upon reflection.