Sensor determination of the degree of wheat grain damage by smut mushrooms

The article describes the developed method for determining the degree of damage to wheat grain by smut fungi, which allows to determine its non-toxic level, increase the measurement accuracy and reliability of the results, to ensure the simplicity of processing the results, to prevent further damage to wheat grain and to ensure its safety without compromising quality. As smut reduces the yield, worsens the quality of grain and grain products, and improving the sanitary condition of grain raw materials is an urgent problem. It was established that the developed method allows to significantly reduce the cost of analysis by 300-320 rubles, reduce the time for analysis by 20-25 minutes, reduce the measurement error from 15% to 10%.