Technological properties of grain and flour in soft wheat lines with introgression from Aegilops speltoides Tausch

The technological properties of grain was studied in three spring lines and one winter line of soft wheat of the Rodina variety with introgression from Aegilops speltoides, the wild diploid gramineous plant. It was established that the presence in genome of two wheat lines of 1B/1R trans-location and genes of com storage protein degrades significantly flour strength and makes worse the dough physical properties. In the absence of translocation and genes of foreign protein the chromosomal substitution 7D/7S makes better greatly the dough Theological properties, and corresponding line may be add to strong wheat.